SSSAJ -- Index by Author (Jul 2004; Volume 68, Number 4)

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Index by Author: Jul 2004; 68 (4) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Alberts, E. E. [Abstract] [Full Text]; Allmaras, R. R. [Abstract] [Full Text]; Allmaras, R. R. [Abstract] [Full Text]; Anderson, S. H. [Abstract] [Full Text]; Angers, Denis A. [Abstract] [Full Text]; Assouline, S. [Abstract] [Full Text]
B: Benson, E. J. [Abstract] [Full Text]; Bertrand, Normand [Abstract] [Full Text]; Bigham, Jerry M. [Abstract] [Full Text]; Billett, M. F. [Abstract] [Full Text]; Boivin, Pascal [Abstract] [Full Text]; Bresson, L. M. [Abstract] [Full Text]
C: Cabrera, M. L. [Abstract] [Full Text]; Cameron, Keith C. [Abstract] [Full Text]; Cassman, K. G. [Abstract] [Full Text]; Cassman, K. G. [Abstract] [Full Text]; Chantigny, Martin H. [Abstract] [Full Text]; Chen, D. [Abstract] [Full Text]; Clapp, C. E. [Abstract] [Full Text]; Clapp, C. E. [Abstract] [Full Text]; Condron, Leo M. [Abstract] [Full Text]; Cornelis, Wim M. [Abstract] [Full Text]; Cornelis, Wim M. [Abstract] [Full Text]; Côté, Denis [Abstract] [Full Text]
D: Daniels, W. Lee [Abstract] [Full Text]; Darboux, Frédéric [Abstract] [Full Text]; De Wever, Helene [Abstract] [Full Text]; Deeks, L. K. [Abstract] [Full Text]; Deng, Y. [Abstract] [Full Text]; Di, Hong J. [Abstract] [Full Text]; Díaz-Zorita, M. [Abstract] [Full Text]; Dixon, J. B. [Abstract] [Full Text]; Dontsova, Katerina M. [Abstract] [Full Text]
E: Ebinger, M. [Abstract] [Full Text]; Eynard, A. [Abstract] [Full Text]
F: Fox, Garey A. [Abstract] [Full Text]; Frey, Serita D. [Abstract] [Full Text]
G: Gabriels, Donald [Abstract] [Full Text]; Gabriels, Donald [Abstract] [Full Text]; Galbraith, John M. [Abstract] [Full Text]; Gantzer, C. J. [Abstract] [Full Text]; Garbrecht, J. D. [Abstract] [Full Text]; Garnier, Patricia [Abstract] [Full Text]; Goddard, T. W. [Abstract] [Full Text]; Graham, Robert C. [Abstract] [Full Text]; Gray, C. W. [Abstract] [Full Text]; Grove, J. H. [Abstract] [Full Text]; Günther, D. [Abstract] [Full Text]
H: Haering, Kathryn C. [Abstract] [Full Text]; Halvorson, Ardell D. [Abstract] [Full Text]; Ham, J. M. [Abstract] [Full Text]; Hartmann, Roger [Abstract] [Full Text]; Hartmann, Roger [Abstract] [Full Text]; He, X. [Abstract] [Full Text]; Hitsuda, Kiyoko [Abstract] [Full Text]; Horino, Haruhiko [Abstract] [Full Text]; Horn, Rainer [Abstract] [Full Text]; Huang, Chi-hua [Abstract] [Full Text]; Huang, P. M. [Abstract] [Full Text]
I: Izaurralde, R. C. [Abstract] [Full Text]
J: Johnston, Cliff T. [Abstract] [Full Text]; Juo, A. S. R. [Abstract] [Full Text]
K: Kaspar, Thomas C. [Abstract] [Full Text]; Kaupenjohann, Martin [Abstract] [Full Text]; Kay, B. D. [Abstract] [Full Text]; Kendrick, Katherine J. [Abstract] [Full Text]; Kenst, A. B. [Abstract] [Full Text]; Kissel, D. E. [Abstract] [Full Text]; Klepker, Dirceu [Abstract] [Full Text]; Kozak, L. M. [Abstract] [Full Text]
L: Lal, R. [Abstract] [Full Text]; Lemke, R. L. [Abstract] [Full Text]; Liebig, Mark A. [Abstract] [Full Text]; Lindbo, D. L. [Abstract] [Full Text]; Linden, D. R. [Abstract] [Full Text]; Lindstrom, M. J. [Abstract] [Full Text]; Liu, C. [Abstract] [Full Text]; Liu, Min [Abstract] [Full Text]
M: Malo, D. D. [Abstract] [Full Text]; McConkey, B. [Abstract] [Full Text]; McInnes, K. J. [Abstract] [Full Text]; McLaren, R. G. [Abstract] [Full Text]; Merckx, Roel [Abstract] [Full Text]; Merrill, Stephen D. [Abstract] [Full Text]; Moran, C. J. [Abstract] [Full Text]; Moroizumi, Toshitsugu [Abstract] [Full Text]
N: Nearing, M. A. [Abstract] [Full Text]; Norton, L. Darrell [Abstract] [Full Text]
O: Olk, D. C. [Abstract] [Full Text]; Olk, D. C. [Abstract] [Full Text]
P: Parkin, Timothy B. [Abstract] [Full Text]; Perfect, E. [Abstract] [Full Text]
R: Rachman, Achmad [Abstract] [Full Text]; Reicosky, D. C. [Abstract] [Full Text]; Robinson, J. Stephen [Abstract] [Full Text]; Rochette, Philippe [Abstract] [Full Text]
S: Sabbagh, G. J. [Abstract] [Full Text]; Saha, U. K. [Abstract] [Full Text]; Schumacher, T. E. [Abstract] [Full Text]; Searcy, S. W. [Abstract] [Full Text]; Sfredo, Gedi J. [Abstract] [Full Text]; Shuai, Xiufu [Abstract] [Full Text]; Shukla, M. K. [Abstract] [Full Text]; Siddique, Muhammad Tariq [Abstract] [Full Text]; Siemens, Jan [Abstract] [Full Text]; Simpson, Rodney T. [Abstract] [Full Text]; Sinaj, S. [Abstract] [Full Text]; Six, Johan [Abstract] [Full Text]; Skaggs, R. W. [Abstract] [Full Text]; Smith, C. J. [Abstract] [Full Text]; Steiner, J. L. [Abstract] [Full Text]; Strong, David T. [Abstract] [Full Text]; Stutter, M. I. [Abstract] [Full Text]
T: Tanaka, Donald L. [Abstract] [Full Text]; Tessier, Daniel [Abstract] [Full Text]; Thiet, Rachel K. [Abstract] [Full Text]; Toor, Gurpal S. [Abstract] [Full Text]
U: Underwood, J. [Abstract] [Full Text]
V: VandenBygaart, A. J. [Abstract] [Full Text]; Ve, Nguyen Bao [Abstract] [Full Text]; Ve, Nguyen Bao [Abstract] [Full Text]; Vendrell, P. F. [Abstract] [Full Text]; Vepraskas, M. J. [Abstract] [Full Text]
W: Wang, W. J. [Abstract] [Full Text]; Weil, Ray R. [Abstract] [Full Text]; West, S. L. [Abstract] [Full Text]; White, G. N. [Abstract] [Full Text]; Williams, Stacey M. [Abstract] [Full Text]; Wilts, A. R. [Abstract] [Full Text]
Y: Yang, C. [Abstract] [Full Text]; Yost, Russell S. [Abstract] [Full Text]
Z: Zhang, X.-C. [Abstract] [Full Text]; Zhang, Z. [Abstract] [Full Text]; Zheng, Fen-li [Abstract] [Full Text]

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