This issue's cover: In situ digital video images of soil obtained with a Soil Imaging Penetrometer (SIP) developed jointly by D.J. Rooney, J.M. Norman, and S.H. Lieberman through the University of Wisconsin-Madison (NASA funded Regional Earth Science Application Center, RESAC), the U.S. Navy, and Earth Information Technologies, Corp. The images show soil structure at 32 cm and fine sand at 126 cm. The SIP enables real-time and continuous viewing of the subsurface strata. When combined with penetrometers to map soil physical properties, the SIP can greatly enhance the efficiency, accuracy, and usefulness of digital subsurface mapping and sampling techniques. See "A Profile Cone Penetrometer for Mapping Soil Horizons" by D.J. Rooney and B. Lowery, p. 2136-2139.