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DIVISION S-2—NOTES

Organic carbon at soil particle surfaces—evidence from x-ray photoelectron spectroscopy and surface abrasion

^a Institute of Soil Science and Soil Geography, University of Bayreuth, 95440 Bayreuth, Germany
^b Institute of Physical Chemistry II, University of Bayreuth, 95440 Bayreuth, Germany

* Corresponding author (klaus.kaiser{at}uni-bayreuth.de)

This study aimed at investigating the potential of x-ray photoelectron spectroscopy (XPS) for investigating soil organic matter at secondary soil particles. The XPS was applied to microaggregates of the A horizon of a Typic Haplustoll (<20-µm equivalent diameter, >53-µm maximum real diameter) and to the fine-earth fraction (<2 mm) of the Bs horizon of a Typic Haplorthod. Carbon and N, as well as Si (both samples), Ca (Haplustoll), and Al (Haplorthod) were detected. Removing the particle surface layer (<50 nm) by bombarding with Ar⁺ resulted in a strong reduction of the signals of C and N, while those attributed to inorganic components increased relatively. Consequently, in both soils, organic matter was concentrated at the surface of soil aggregates. We conclude that Ar⁺ sputtering followed by XPS analysis is a useful tool in identifying the accumulation of elements at the surfaces of soil particles.

Abbreviations: XPS, x-ray photoelectron spectroscopy

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