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Dep. of Soil Science, Univ. of Wisconsin, 1525 Observatory Dr., Madison, WI, 53706-1299 USA
rooney{at}earthit.com
Accurate soil mapping at a fine scale is needed for site-specific farming, research on solute transport, and many other applications requiring detailed analysis of both the depth and thickness of soil horizons. Soil mapping techniques currently used are too costly to address the spatial variability of soil mapping units. We propose the use of a profile cone penetrometer (PCP) to assist in mapping soil properties at a landscape scale. Data collected with the PCP show clear changes in soil properties with depth, and were confirmed using profile descriptions from soil pits as well as 4.3-cm-diam soil cores. Combining three-dimensional PCP data with soil attribute information will provide a rapid and effective means to digitally update soil surveys and improve the efficiency and cost effectiveness of sampling techniques.
Abbreviations: CI, cone index PCP, profile cone penetrometer
This article has been cited by other articles:
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E. Ben-Dor, D. Heller, and A. Chudnovsky A Novel Method of Classifying Soil Profiles in the Field using Optical Means Soil Sci. Soc. Am. J., June 18, 2008; 72(4): 1113 - 1123. [Abstract] [Full Text] [PDF] |
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